High Spatial Resolution for IR Imaging Using an IR Diode Laser

By coupling an infrared diode laser to a conventional infrared microscope, one achieves resolution approaching the diffraction limit while enabling rapid data collection. This technique is demonstrated with the use of a layered polymer sample that has been contaminated by migration of a volatile add...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied spectroscopy 2000-02, Vol.54 (2), p.159-163
Hauptverfasser: Bailey, James A., Dyer, R. Brian, Graff, Darla K., Schoonover, Jon R.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:By coupling an infrared diode laser to a conventional infrared microscope, one achieves resolution approaching the diffraction limit while enabling rapid data collection. This technique is demonstrated with the use of a layered polymer sample that has been contaminated by migration of a volatile additive from an exogenous source. The distribution of this additive in the layered structure is shown to correlate with specific layers and reveals a concentration gradient suggesting a diffusive mechanism of additive migration parallel to the layered structure.
ISSN:0003-7028
1943-3530
DOI:10.1366/0003702001949122