Wetting and molecular orientation of 8CB on silicon substrates

The wetting properties of 8CB ( 4(')-n-octyl-4-cyanobiphenyl) on silicon wafers have been studied with scanning polarization force microscopy (SPFM). Layer-by-layer spreading of 8CB droplets is observed. With the help of the surface potential mapping capability of SPFM, we found that the molecu...

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Veröffentlicht in:Physical review letters 2000-02, Vol.84 (7), p.1519-1522
Hauptverfasser: Xu, L, Salmeron, M, Bardon, S
Format: Artikel
Sprache:eng
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Zusammenfassung:The wetting properties of 8CB ( 4(')-n-octyl-4-cyanobiphenyl) on silicon wafers have been studied with scanning polarization force microscopy (SPFM). Layer-by-layer spreading of 8CB droplets is observed. With the help of the surface potential mapping capability of SPFM, we found that the molecular dipole of the first monolayer of 8CB is parallel to the surface. A layer of nearly vertical molecular dimers on top of the monolayer has an associated surface potential of 40 mV, which is attributed to a distortion of the dimer. The dimer distortion propagates to the subsequent smectic bilayers, producing an additional 7 mV potential increase in the second layer, 2 mV on the third, and approximately 1 mV on the fourth.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.84.1519