Shape change as an indicator of mechanism in the high-pressure structural transformations of CdSe nanocrystals

X-ray diffraction was used to monitor the structure of 45 A diameter CdSe nanocrystals as they transformed repeatedly between fourfold and sixfold coordinated crystal structures. Simulations of the diffraction patterns reveal that a shape change occurs as the crystals transform. They also show that...

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Veröffentlicht in:Physical review letters 2000-01, Vol.84 (5), p.923-926
Hauptverfasser: Wickham, JN, Herhold, AB, Alivisatos, AP
Format: Artikel
Sprache:eng
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Zusammenfassung:X-ray diffraction was used to monitor the structure of 45 A diameter CdSe nanocrystals as they transformed repeatedly between fourfold and sixfold coordinated crystal structures. Simulations of the diffraction patterns reveal that a shape change occurs as the crystals transform. They also show that stacking faults are generated in the transition from the high- to the low-pressure phase. The shape change and stacking fault generation place significant constraints on the possible microscopic mechanism of the phase transition.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.84.923