Engineering metal oxidation using epitaxial strain

The oxides of platinum group metals are promising for future electronics and spintronics due to the delicate interplay of spin-orbit coupling and electron correlation energies. However, their synthesis as thin films remains challenging due to their low vapour pressures and low oxidation potentials....

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Veröffentlicht in:Nature nanotechnology 2023-09, Vol.18 (9), p.1005-1011
Hauptverfasser: Nair, Sreejith, Yang, Zhifei, Lee, Dooyong, Guo, Silu, Sadowski, Jerzy T., Johnson, Spencer, Saboor, Abdul, Li, Yan, Zhou, Hua, Comes, Ryan B., Jin, Wencan, Mkhoyan, K. Andre, Janotti, Anderson, Jalan, Bharat
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Sprache:eng
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Zusammenfassung:The oxides of platinum group metals are promising for future electronics and spintronics due to the delicate interplay of spin-orbit coupling and electron correlation energies. However, their synthesis as thin films remains challenging due to their low vapour pressures and low oxidation potentials. Here we show how epitaxial strain can be used as a control knob to enhance metal oxidation. Using Ir as an example, we demonstrate the use of epitaxial strain in engineering its oxidation chemistry, enabling phase-pure Ir or IrO 2 films despite using identical growth conditions. The observations are explained using a density-functional-theory-based modified formation enthalpy framework, which highlights the important role of metal-substrate epitaxial strain in governing the oxide formation enthalpy. We also validate the generality of this principle by demonstrating epitaxial strain effect on Ru oxidation. The IrO 2 films studied in our work further revealed quantum oscillations, attesting to the excellent film quality. The epitaxial strain approach we present could enable growth of oxide films of hard-to-oxidize elements using strain engineering. A quest to resolve ultra-high vacuum synthesis of high-quality, single-crystalline metal oxide thin films containing hard-to-oxidize metals reveals a hidden role of epitaxial strain on the metal oxidation chemistry and resulting thin-film growth.
ISSN:1748-3387
1748-3395
1748-3395
DOI:10.1038/s41565-023-01397-0