High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC
Radiography of low-contrast features in high-density materials evolving on a nanosecond timescale requires a bright photon source in the tens of keV range with high temporal and spatial resolution. One application for sources in this category is the study of dynamic material strength in samples comp...
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Veröffentlicht in: | Review of scientific instruments 2021-03, Vol.92 (3) |
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Sprache: | eng |
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Zusammenfassung: | Radiography of low-contrast features in high-density materials evolving on a nanosecond timescale requires a bright photon source in the tens of keV range with high temporal and spatial resolution. One application for sources in this category is the study of dynamic material strength in samples compressed to Mbar pressures at the National Ignition Facility, high-resolution measurements of plastic deformation under conditions relevant to meteor impacts, geophysics, armor development, and inertial confinement fusion. Here, we present radiographic data and the modulation transfer function (MTF) analysis of a multi-component test object probed at ~100 keV effective backlighter energy using a 5 μm-thin dysprosium foil driven by the NIF Advanced Radiographic Capability (ARC) short-pulse laser (~2 kJ, 10 ps). The thin edge of the foil acts as a bright line-projection source of hard x rays, which images the test object at 13.2× magnification into a filtered and shielded image plate detector stack. The system demonstrates a superior contrast of shallow (5 μm amplitude) sinusoidal ripples on gold samples up to 90 μm thick as well as enhanced spatial and temporal resolution using only a small fraction of the laser energy compared to an existing long-pulse-driven backlighter used routinely at the NIF for dynamic strength experiments. |
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ISSN: | 0034-6748 1089-7623 |