Transient magnetic field diffusion considerations relevant to magnetically assisted indirect drive inertial confinement fusion

Application of a magnetic field to an indirect drive inertial confinement fusion target requires diffusion of the field through the high-Z and electrically conducting Hohlraum. The onset of the external field generates eddy currents in the Hohlraum wall that result in (1) a reduction of the peak fie...

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Veröffentlicht in:Physics of plasmas 2020-11, Vol.27 (11)
Hauptverfasser: Moody, J. D., Johnson, A., Javedani, J., Carroll, E., Fry, J., Kozioziemski, B., Kucheyev, S. O., Logan, B. G., Pollock, B. B., Sio, H., Strozzi, D., Stygar, W. A., Tang, V., Winters, S.
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Sprache:eng
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Zusammenfassung:Application of a magnetic field to an indirect drive inertial confinement fusion target requires diffusion of the field through the high-Z and electrically conducting Hohlraum. The onset of the external field generates eddy currents in the Hohlraum wall that result in (1) a reduction of the peak field at the capsule, (2) heating of the Hohlraum wall through Ohmic dissipation, and (3) wall movement due to the inward force from the eddy current interacting with the field. Heating of the wall causes an increase in blackbody radiation which can preheat the capsule and frozen deuterium–tritium fuel, while wall motion leads to potential misalignment of the lasers at the Hohlraum wall. Limiting these detrimental effects sets requirements on the tolerable magnitude of each effect. We present a nonlinear model for B-field diffusion through an infinitely long thin-walled cylinder with a temperature dependent resistivity, to show that a 15 μm thick wall of pure gold fails to meet these requirements. A new Hohlraum material made from an alloy of Au and Ta has a measured resistivity of ≥ 60 times that of Au and is shown with the nonlinear model to meet the requirements for magnetization. We compare the nonlinear model to simulations of the actual Hohlraum target using a finite element code which includes temperature-dependent Hohlraum resistivity.
ISSN:1070-664X
1089-7674
DOI:10.1063/5.0022722