Defect activation and annihilation in CIGS solar cells: an operando x-ray microscopy study

The efficiency of thin-film solar cells with a Cu( In 1 − x Ga x )Se 2 absorber is limited by nanoscopic inhomogeneities and defects. Traditional characterization methods are challenged by the multi-scale evaluation of the performance at defects that are buried in the device structures. Multi-modal...

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Veröffentlicht in:	JPhys Energy 2020-04, Vol.2 (2), p.25001
Hauptverfasser:	Stuckelberger, Michael E, Nietzold, Tara, West, Bradley, Farshchi, Rouin, Poplavskyy, Dmitry, Bailey, Jeff, Lai, Barry, Maser, Jörg M, Bertoni, Mariana I
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorbers Bias Buried structures Copper indium gallium selenides Correlation Crystal defects Grain size MATERIALS SCIENCE Microscopy Performance evaluation Photovoltaic cells Room temperature Solar cells SOLAR ENERGY Spatial resolution Temperature dependence X ray microscopy
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