Exploring New Science Domains with Atom Probe Tomography Enabled by an Environmental Transfer Hub

The liquid/solid and gas/solid interface represents a rich scientific and technological frontier for discovery and innovation in many areas of science. However, the direct nano- to atomic-scale characterization of these interfaces is technically challenging within broad range of analytical tools tha...

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Veröffentlicht in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.276-277
Hauptverfasser: Perea, Daniel E., Schreiber, Daniel K., Devaraj, Arun, Reilly, Dallas D., Lambeets, Sten V., Kautz, Elizabeth J., Lach, Timothy G., Wirth, Mark G., Evans, James E.
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Sprache:eng
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Zusammenfassung:The liquid/solid and gas/solid interface represents a rich scientific and technological frontier for discovery and innovation in many areas of science. However, the direct nano- to atomic-scale characterization of these interfaces is technically challenging within broad range of analytical tools that require high to ultrahigh vacuum conditions. This challenge has been largely addressed within the electron microscopy (EM) community through the development of unique specimen holders and differentially-pumped vacuum systems that allow researchers to probe, in situ, liquid/solid and gas/solid interfaces using electron probes [1]. However, the direct application of APT to liquid/solid and gas/solid interfaces is not possible and requires the development of unique specimen preparation and handling of cryogenically-frozen specimens and/or work with specimens under environmentally-protected conditions. At PNNL, we have developed unique suite of hardware and experimental protocols for the preparation and handling of environmentally-sensitive materials centered around the combination of a unique environmental transfer hub, specimen suitcase device, and modified cryo FIB/SEM capabilities (Fig. 1a) [2-3]. The ability to prepare, manipulate, and transfer specimens under either cryogenic or vacuum conditions thus provides a means to uniquely apply APT analysis to a wide variety of material systems that would not be possible otherwise. Here we describe some specific examples, shown in Figure 1b, of APT analysis applied to temperature sensitive material systems requiring cryo specimen preparation and transfer, as well as air sensitive materials systems requiring vacuum or inert vacuum transfer.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619002113