Near-nanoscale-resolved energy band structure of LaNiO3/La2/3Sr1/3MnO3/SrTiO3 heterostructures and their interfaces

Depth-resolved cathodoluminescence spectroscopy (DRCLS) studies of LNO/LSMO/STO interfaces display an ability to detect optical transitions between orbital-derived energy levels with filled states near the Fermi level of ultrathin complex oxides and to detect changes in the electronic structure at t...

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Veröffentlicht in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2015-07, Vol.33 (4)
Hauptverfasser: Asel, Thaddeus J., Gao, Hantian, Heinl, Tyler J., Adkins, Drew, Woodward, Patrick M., Hoffman, Jason, Bhattacharya, Anand, Brillson, Leonard J.
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Sprache:eng
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Zusammenfassung:Depth-resolved cathodoluminescence spectroscopy (DRCLS) studies of LNO/LSMO/STO interfaces display an ability to detect optical transitions between orbital-derived energy levels with filled states near the Fermi level of ultrathin complex oxides and to detect changes in the electronic structure at their interfaces on a near-nanometer scale. A differential form of DRCLS (DDRCLS) provides a unique capability to measure electronic features at buried interfaces of ultrathin complex oxide films. DDRCLS measurements demonstrate the abruptness of LNO/LSMO interfaces but atomic layer distortions and altered optical emissions at the LSMO/STO heterojunction. The capability to probe electronic structure at buried complex oxide interfaces with enhanced depth resolution can reveal changes in energy levels within nanometers of interfaces, band alignments across interfaces, and the possible effect of local defects on these energy levels.
ISSN:2166-2746
2166-2754
DOI:10.1116/1.4922270