Dual crystal x-ray spectrometer at 1.8 keV for high repetition-rate single-photon counting spectroscopy experiments
With the recent development of high-repetition rate x-ray free electron lasers (FEL), it is now possible to perform x-ray scattering and emission spectroscopy measurements from thin foils or gasses heated to high-energy density conditions by integrating over many experimental shots. Since the expect...
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Veröffentlicht in: | Journal of instrumentation 2016-08, Vol.11 (8), p.P08015-P08015 |
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Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | With the recent development of high-repetition rate x-ray free electron lasers (FEL), it is now possible to perform x-ray scattering and emission spectroscopy measurements from thin foils or gasses heated to high-energy density conditions by integrating over many experimental shots. Since the expected signal may be weaker than the typical CCD readout noise over the region-of-interest, it is critical to the success of this approach to use a detector with high-energy resolution so that single x-ray photons may be isolated. Here we describe a dual channel x-ray spectrometer developed for the Atomic and Molecular Optics endstation at the Linac Coherent Light Source (LCLS) for x-ray spectroscopy near the K-edge of aluminum. The spectrometer is based on a pair of curved PET (002) crystals coupled to a single pnCCD detector which simultaneously measures x-ray scattering and emission in the forward and backward directions. The signals from single x-ray photons are accumulated permitting continuous single-shot acquisition at 120 Hz. |
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ISSN: | 1748-0221 1748-0221 |
DOI: | 10.1088/1748-0221/11/08/P08015 |