Measuring the temporal structure of few-femtosecond free-electron laser X-ray pulses directly in the time domain

Short-wavelength free-electron lasers are now well established as essential and unrivalled sources of ultrabright coherent X-ray radiation. One of the key characteristics of these intense X-ray pulses is their expected few-femtosecond duration. No measurement has succeeded so far in directly determi...

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Veröffentlicht in:Nature photonics 2014-11, Vol.8 (12), p.950-957
Hauptverfasser: Helml, W., Maier, A. R., Schweinberger, W., Grguraš, I., Radcliffe, P., Doumy, G., Roedig, C., Gagnon, J., Messerschmidt, M., Schorb, S., Bostedt, C., Grüner, F., DiMauro, L. F., Cubaynes, D., Bozek, J. D., Tschentscher, Th, Costello, J. T., Meyer, M., Coffee, R., Düsterer, S., Cavalieri, A. L., Kienberger, R.
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Sprache:eng
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Zusammenfassung:Short-wavelength free-electron lasers are now well established as essential and unrivalled sources of ultrabright coherent X-ray radiation. One of the key characteristics of these intense X-ray pulses is their expected few-femtosecond duration. No measurement has succeeded so far in directly determining the temporal structure or even the duration of these ultrashort pulses in the few-femtosecond range. Here, by deploying the so-called streaking spectroscopy technique at the Linac Coherent Light Source, we demonstrate a non-invasive scheme for temporal characterization of X-ray pulses with sub-femtosecond resolution. This method is independent of photon energy, decoupled from machine parameters, and provides an upper bound on the X-ray pulse duration. We measured the duration of the shortest X-ray pulses currently available to be on average no longer than 4.4 fs. Analysing the pulse substructure indicates a small percentage of the free-electron laser pulses consisting of individual high-intensity spikes to be on the order of hundreds of attoseconds. Using a spectroscopy streaking technique at LCLS (Linac Coherent Light Source), researchers demonstrate temporal characterization of X-ray pulses with sub-femtosecond resolution.
ISSN:1749-4885
1749-4893
DOI:10.1038/nphoton.2014.278