Low-emittance electron bunches from a laser-plasma accelerator measured using single-shot x-ray spectroscopy

X-ray spectroscopy is used to obtain single-shot information on electron beam emittance in a low-energy-spread 0.5 GeV-class laser-plasma accelerator. Measurements of betatron radiation from 2 to 20 keV used a CCD and single-photon counting techniques. By matching x-ray spectra to betatron radiation...

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Veröffentlicht in:Physical review letters 2012-08, Vol.109 (6), p.064802-064802, Article 064802
Hauptverfasser: Plateau, G R, Geddes, C G R, Thorn, D B, Chen, M, Benedetti, C, Esarey, E, Gonsalves, A J, Matlis, N H, Nakamura, K, Schroeder, C B, Shiraishi, S, Sokollik, T, van Tilborg, J, Toth, Cs, Trotsenko, S, Kim, T S, Battaglia, M, Stöhlker, Th, Leemans, W P
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Sprache:eng
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Zusammenfassung:X-ray spectroscopy is used to obtain single-shot information on electron beam emittance in a low-energy-spread 0.5 GeV-class laser-plasma accelerator. Measurements of betatron radiation from 2 to 20 keV used a CCD and single-photon counting techniques. By matching x-ray spectra to betatron radiation models, the electron bunch radius inside the plasma is estimated to be ~0.1 μm. Combining this with simultaneous electron spectra, normalized transverse emittance is estimated to be as low as 0.1 mm mrad, consistent with three-dimensional particle-in-cell simulations. Correlations of the bunch radius with electron beam parameters are presented.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.109.064802