X-ray parametric down-conversion in the Langevin regime

We experimentally and theoretically study the coincidence count rate for down-converted x-ray photons. Because of photoionization, parametric down-conversion at x-ray wavelengths generally involves loss and the theoretical description requires a Langevin approach. By working in a transmission geomet...

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Veröffentlicht in:Physical review letters 2012-07, Vol.109 (1), p.013602-013602, Article 013602
Hauptverfasser: Shwartz, S, Coffee, R N, Feldkamp, J M, Feng, Y, Hastings, J B, Yin, G Y, Harris, S E
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Sprache:eng
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Zusammenfassung:We experimentally and theoretically study the coincidence count rate for down-converted x-ray photons. Because of photoionization, parametric down-conversion at x-ray wavelengths generally involves loss and the theoretical description requires a Langevin approach. By working in a transmission geometry (Laue) rather than in the Bragg geometry of previous experiments, we obtain an improvement in the signal-to-noise ratio of 12.5, and find agreement between experiment and theory.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.109.013602