Electron Transfer and Ionic Displacements at the Origin of the 2D Electron Gas at the LAO/STO Interface: Direct Measurements with Atomic-Column Spatial Resolution
Using state‐of‐the‐art, aberration‐corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic‐scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfac...
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Veröffentlicht in: | Advanced materials (Weinheim) 2012-08, Vol.24 (29), p.3952-3957 |
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Hauptverfasser: | , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Using state‐of‐the‐art, aberration‐corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic‐scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas. |
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ISSN: | 0935-9648 1521-4095 |
DOI: | 10.1002/adma.201200667 |