In situ x-ray investigation of freestanding nanoscale Cu-Nb multilayers under tensile load

The yield behavior in a freestanding sputter-deposited Cu/Nb multilayer with 30 nm nominal individual layer thickness has been investigated with in situ synchrotron x-ray diffraction during tensile loading. A pronounced elastic-plastic transition is observed with the fraction of plastically yielded...

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Veröffentlicht in:	Applied physics letters 2009-01, Vol.94 (3), p.031906-031906-3
Hauptverfasser:	Aydıner, C. C., Brown, D. W., Mara, N. A., Almer, J., Misra, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	ANISOTROPY CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS PLASTICS RESIDUAL STRESSES SYNCHROTRONS THICKNESS X-RAY DIFFRACTION
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