Reversal of asymmetry of X-ray peak profiles from individual grains during a strain path change

Reversal of asymmetry of X-ray peak profiles from individual grains during a strain path change

X-ray peak profiles are measured from individual bulk grains during tensile deformation. Two differently oriented copper samples pre-deformed in tension show the expected peak profile asymmetry caused by intra-grain stresses. One of the samples is oriented to achieve a significant change of the intr...

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Veröffentlicht in:Scripta materialia 2010-05, Vol.62 (10), p.794-797
Hauptverfasser: Wejdemann, C., Lienert, U., Pantleon, W.
Format: Artikel
Sprache:eng
Schlagworte:
ASYMMETRY
COPPER
DEFORMATION
Dislocation structure
DISLOCATIONS
LINE BROADENING
MATERIALS SCIENCE
Plastic deformation
PLASTICS
Strain path change
STRAINS
STRESSES
X-RAY DIFFRACTION
X-ray diffraction (XRD)
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Beschreibung
Zusammenfassung:X-ray peak profiles are measured from individual bulk grains during tensile deformation. Two differently oriented copper samples pre-deformed in tension show the expected peak profile asymmetry caused by intra-grain stresses. One of the samples is oriented to achieve a significant change of the intra-grain stresses during in situ tensile loading and this is observed as a reversal of the sign of the peak profile asymmetry.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2010.01.032