Overview of the Current Status of Technical Development for a Highly Scalable, High-Speed, Non-Volatile Phase-Change Memory

The present status of technical development of a highly scalable, high-speed non-volatile PCM is overviewed. Major technical challenges are described along with solutions that are being pursued in terms of innovative device structures and fabrication technologies, new phase change materials, and new...

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Veröffentlicht in:Journal of semiconductor technology and science 2008, 8(1), , pp.1-10
Hauptverfasser: Lee, Su-Youn, Jeong, Jeung-Hyun, Cheong, Byung-Ki
Format: Artikel
Sprache:eng
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Zusammenfassung:The present status of technical development of a highly scalable, high-speed non-volatile PCM is overviewed. Major technical challenges are described along with solutions that are being pursued in terms of innovative device structures and fabrication technologies, new phase change materials, and new memory schemes. KCI Citation Count: 1
ISSN:1598-1657
2233-4866
DOI:10.5573/JSTS.2008.8.1.001