Development of a Fast Sample-exchange System for Fixed Target Single-shot Imaging at PAL-XFEL

This paper describes the development of a fast exchange system to exchange thin membrane containing samples for single-shot experiments using micron focusing X-ray pulses at Pohang Accelerator Laboratory X-ray free electron laser (PAL-XFEL). The mechanism uses a compact gripper that can remove used...

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Veröffentlicht in:Journal of the Korean Physical Society 2020, 76(6), , pp.448-452
Hauptverfasser: Nam, Daewoong, Kim, Sangsoo, Kim, Myong-jin, Kim, Seonghan
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Sprache:eng
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Zusammenfassung:This paper describes the development of a fast exchange system to exchange thin membrane containing samples for single-shot experiments using micron focusing X-ray pulses at Pohang Accelerator Laboratory X-ray free electron laser (PAL-XFEL). The mechanism uses a compact gripper that can remove used samples and mount new ones in a vacuum chamber. The lead time of sample exchange is reduced more than half and increases data-collection time during limited beamtime. We believe that this
ISSN:0374-4884
1976-8524
DOI:10.3938/jkps.76.448