Optimisation of readout performance of phase-change probe memory in terms of capping layer and probe tip

The capping layer and the probe tip that serve as the protective layer and the recording tool, respectively, for phase-change probe memory play an important role on the writing performance of phase-change probe memory, thus receiving considerable attention. On the other hand, their influence on the...

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Veröffentlicht in:Electronic materials letters 2014, 10(6), , pp.1045-1049
Hauptverfasser: Wang, Lei, Wright, C. David, Aziz, Mustafa. M., Yang, Ci Hui, Yang, Guo Wei
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Sprache:eng
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Zusammenfassung:The capping layer and the probe tip that serve as the protective layer and the recording tool, respectively, for phase-change probe memory play an important role on the writing performance of phase-change probe memory, thus receiving considerable attention. On the other hand, their influence on the readout performance of phasechange probe memory has rarely been reported before. A three-dimensional parametric study based on the Laplace equation was therefore conducted to investigate the effect of the capping layer and the probe tip on the resulting reading contrast for the two cases of reading a crystalline bit from an amorphous matrix and reading an amorphous bit from a crystalline matrix. The results indicated that a capping layer with a thickness of 2 nm and an electrical conductivity of 50 Ω −1 m −1 is able to provide an appropriate reading contrast for both the cases, while satisfying the previous writing requirement, particularly with the assistance of a platinum silicide probe tip.
ISSN:1738-8090
2093-6788
DOI:10.1007/s13391-014-4021-x