입체화상으로부터 3차원 마이크로계의 효과적인 깊이측정

This study represents the efficient depth measurement for 3-dimensional microsystems using the disparity histogram from stereo images. Implementation of user-friendly Windows program written in C++ involves the various methods for the stereo-image processing in which the minimization of matching-pix...

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Veröffentlicht in:한국생산제조학회지 2007, 16(5), , pp.178-182
Hauptverfasser: 황진우(J.-W. Hwang), 이중(J. Lee), 윤도영(D.-Y. Yoon)
Format: Artikel
Sprache:kor
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Zusammenfassung:This study represents the efficient depth measurement for 3-dimensional microsystems using the disparity histogram from stereo images. Implementation of user-friendly Windows program written in C++ involves the various methods for the stereo-image processing in which the minimization of matching-pixel error upon the unique point for stereo images was carried out as a pre-processing method. Even though MPC among various methods was adopted in the present measurement, the resulting measurements seem to require optimizations of the windows sizes and corrections of post-manipulation for stereo images. The present work using Windows program is promising to measure the 3-dimensional depth of micro-system efficiently in implementing the 3-dimensional structure of micro-systems. KCI Citation Count: 0
ISSN:2508-5093
2508-5107