Light Emission from Silicon Nanocrystals - Size Does Matter

A brief overview of two recent Si nanocrystal studies undertaken at the Australian National University is presented: recent work on hydrogen passivation of non-radiative defects and attempts to measure optical gain in waveguide structures. In the rst study, a generalized treatment of hydrogen passiv...

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Veröffentlicht in:Journal of the Korean Physical Society 2004, 45(3), , pp.656-660
Hauptverfasser: Robert G. Elliman, Andrew R. Wilkinson, Barry Luther-Davies, Marc G. Spooner, Marek Samoc, Max J. Lederer, Nathanael Smith, Tessica D.M. Weijers
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Sprache:eng
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Zusammenfassung:A brief overview of two recent Si nanocrystal studies undertaken at the Australian National University is presented: recent work on hydrogen passivation of non-radiative defects and attempts to measure optical gain in waveguide structures. In the rst study, a generalized treatment of hydrogen passivation and desorption is employed to model the in uence of hydrogen on silicon nanocrystal luminescence. Values for reaction-rate parameters are determined from the model and found to be in excellent agreement with values previously determined for paramagnetic Si danglingbond defects (Pb-type centers) found at planar Si/SiO2 interfaces. In the second study, an attempt is made to measure optical gain in silicon nanocrystals by monitoring the intensity of a probe beam propagating in a waveguide structure containing silicon nanocrystals during photo-excitation of the nanocrystals. The probe beam is shown to be attenuated by the excitation demonstrating the dominance of absorptive processes. No gain was observed. KCI Citation Count: 2
ISSN:0374-4884
1976-8524