Light Emission from Silicon Nanocrystals - Size Does Matter
A brief overview of two recent Si nanocrystal studies undertaken at the Australian National University is presented: recent work on hydrogen passivation of non-radiative defects and attempts to measure optical gain in waveguide structures. In the rst study, a generalized treatment of hydrogen passiv...
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Veröffentlicht in: | Journal of the Korean Physical Society 2004, 45(3), , pp.656-660 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A brief overview of two recent Si nanocrystal studies undertaken at the Australian National
University is presented: recent work on hydrogen passivation of non-radiative defects and attempts
to measure optical gain in waveguide structures. In the rst study, a generalized treatment of
hydrogen passivation and desorption is employed to model the in
uence of hydrogen on silicon
nanocrystal luminescence. Values for reaction-rate parameters are determined from the model and
found to be in excellent agreement with values previously determined for paramagnetic Si danglingbond
defects (Pb-type centers) found at planar Si/SiO2 interfaces. In the second study, an attempt
is made to measure optical gain in silicon nanocrystals by monitoring the intensity of a probe beam
propagating in a waveguide structure containing silicon nanocrystals during photo-excitation of
the nanocrystals. The probe beam is shown to be attenuated by the excitation demonstrating the
dominance of absorptive processes. No gain was observed. KCI Citation Count: 2 |
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ISSN: | 0374-4884 1976-8524 |