Device Characteristics of Radio Frequency SAW Filter Fabricated on GaN Thin Film
SAW Characteristics of undoped GaN thin film such as velocity, electro-mechanical coupling coefficient k$^2$, temperature coefficient of frequency (TCF), and propagation loss were investigated. GaN thin film was deposited on sapphire substrate by MOCVD. SAW velocity of 5352 m/s and TCF of $-$61.8 pp...
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Veröffentlicht in: | Journal of the Korean Physical Society 2003, 42(III), , pp.480-482 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | SAW Characteristics of undoped GaN thin film such as velocity,
electro-mechanical coupling coefficient k$^2$, temperature
coefficient of frequency (TCF), and propagation loss were
investigated. GaN thin film was deposited on sapphire substrate by
MOCVD. SAW velocity of 5352 m/s and TCF of $-$61.8 ppm/$^\circ$C
were measured at kh value of 0.3 and a temperature range -30
$\sim$ 80 $^\circ$C. k$^2$ was varied from 4.01 \% to 1.36 \%. The
fabricated SAW filter exhibited good device performance with
insertion loss of $-$36 dB and side lobe attenuation of 20 dB at
the wavelength of 40 $\mu$m ($\lambda$/4 = 10 $\mu$m). The center
frequency was 133.8 MHz. KCI Citation Count: 3 |
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ISSN: | 0374-4884 1976-8524 |