Transport Properties in Samples Containing InAs Self-Assembled Dots and Dashes
We report transport measurements of a two-dimensional electron gas (2DEG) formed in a GaAs/AlGaAs quantum well, in which InAs has been inserted into the centre of the GaAs quantum well. Depending on the capping layers, the InAs forms either self-assembled quantum dots or dashes, and due to the resul...
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Veröffentlicht in: | Journal of the Korean Physical Society 2003, 42(III), , pp.454-457 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We report transport measurements of a two-dimensional electron gas
(2DEG) formed in a GaAs/AlGaAs quantum well, in which InAs has
been inserted into the centre of the GaAs quantum well.
Depending on the capping layers, the InAs forms either
self-assembled quantum dots or dashes, and due to the resulting
strain fields repulsive short-range scattering is experienced by
the conduction electrons in the 2DEG. The single electron
transport is through a dot or dash isolated using a pair of
split-gate deposited on the sample surface. By application of a
source-drain voltage we investigate the energies of a dot or dash
that is trapped within the one dimensional channel defined by the
range 0.5-2 meV. We speculate that the dot and dash are formed
by strain modulation of the conduction of the conduction band in
the GaAs quantum well. KCI Citation Count: 1 |
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ISSN: | 0374-4884 1976-8524 |