Measurement of BaTiO3 domain structure using ultrahigh vacuum - atomic force microscopy(UHV-AFM)
We report the nanoscopic properties of the clean, free surface of a BaTiO3 single crystal in an ultra-high vacuum. Atomic force microscopy, piezoelectric force microscopy and Kelvin force microscopy measurements show that the potential difference between upward and downward 180˚ domain is approx 100...
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Veröffentlicht in: | Journal of the Korean Physical Society 2009, 55(2), , pp.799-802 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We report the nanoscopic properties of the clean, free surface of a BaTiO3 single crystal in an
ultra-high vacuum. Atomic force microscopy, piezoelectric force microscopy and Kelvin force microscopy
measurements show that the potential difference between upward and downward 180˚
domain is approx 100 mV. This value is 100 times smaller than the value estimated by using the
standard 180˚
domain theory. Furthermore, our experiments show that this result cannot be explained
only by the conventional explanations (that is, a decrease in the depolarization field by
closure domains, the compensation of polarization bound charge by contamination or by oxygen excess
and deficiency or ion transport). The results suggest a possibility that an intrinsic electrostatic
shielding mechanism exists in the ferroelectrics and is essential for 180˚ domains. KCI Citation Count: 7 |
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ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.55.799 |