Quantum Efficiency in Multi-quantum well InGaN/GaN Light-emitting Diodes with Electroluminescence Characteristics
The temperature dependence of the electroluminescence spectra of InGaN/GaN multi-quantumwell light-emitting diodes (LEDs) has been investigated over a range of temperatures and currents. The presence of localization effects in the active InGaN layers can be deduced from the observed considerable blu...
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Veröffentlicht in: | Journal of the Korean Physical Society 2009, 55(1), , pp.271-274 |
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Sprache: | eng |
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Zusammenfassung: | The temperature dependence of the electroluminescence spectra of InGaN/GaN multi-quantumwell
light-emitting diodes (LEDs) has been investigated over a range of temperatures and currents.
The presence of localization effects in the active InGaN layers can be deduced from the observed
considerable blue shifts of the electroluminescence emission peak with increasing temperature in
the low-temperature region. Exciton-phonon couplings in the active layer are also observed at low
temperatures. The electroluminescence intensity was measured to determine the internal quantum
efficiency of the LEDs as a function of temperature. When the temperature decreases from room
temperature to 170~200 K, the electroluminescence intensity increases due to a reduction in the
nonradiative recombination, and the internal quantum efficiency is improved. At T < 170 K, the
electroluminescence intensity is reduced significantly. This reduction of the electroluminescence
intensity mainly results from the low carrier capture efficiency in the active layer due to the high
Mg activation energy, the electron-hole separation in multi quantum wells, and the high internal
piezoelectric field. However, in the case of LEDs using a narrow barrier, the electroluminescence
intensity is reduced slightly at low temperatures. Therefore, in order to measure the internal
quantum efficiency by using the temperature dependence of the electroluminescence spectra in
LEDs, one must carefully consider the effects of carrier injection at low temperature. KCI Citation Count: 1 |
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ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.55.271 |