Dielectric and Relaxation Behaviors of Screen-printed CuO-doped (Ba0.5,Sr0.5)TiO3 Thick Films

The crystalline and the dielectric properties of screen-printed 3-wt% CuO doped (Ba0.5,Sr0.5)TiO3 thick film interdigital capacitors have been investigated. To lower the sintering temperature of the (Ba0.5, Sr0.5)TiO3 thick films on the alumina substrates, we added CuO. Twenty (20)-μm-thick films were screen printed on alumina substrates and then interdigital capacitors with five pairs of fingers with a 50-μm fingers gap were fabricated with silver electrodes through the e-beam evaporation process. From the X-ray diffraction analysis, we found that the CuO-doped (Ba0.5, Sr0.5)TiO3 thick films had a perovskite structure. Frequency dependent dielectric properties were measured in the microwave frequency range. Current versus voltage characteristics were analyzed in the elevated temperature range from 30 to 90 ℃. To understand the time-dependent current relaxation behavior, Ⅰ - T (current-time) characteristics were also measured under various applied electric fields. KCI Citation Count: 1