A delta-doped amorphous silicon thin-film transistor with high mobility and stability
Ultrathin doped layers, known as delta-doped layers, were introduced within the intrinsic amorphous silicon (a-Si) active layer to fabricate hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs) with enhanced field-effect mobility. The performance of the delta-doped a-Si:H TFTs depend...
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Veröffentlicht in: | Journal of the Korean Physical Society 2012, 61(11), , pp.1835-1839 |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Ultrathin doped layers, known as delta-doped layers, were introduced within the intrinsic amorphous silicon (a-Si) active layer to fabricate hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs) with enhanced field-effect mobility. The performance of the delta-doped a-Si:H TFTs depended on the phosphine (PH
3
) flow rate and the distance from the n
+
a-Si to the deltadoping layer. The delta-doped a-Si:H TFTs fabricated using a commercial manufacturing process exhibited an enhanced field-effect mobility of approximately ∼0.23 cm
2
/Vs (compared to a conventional a-Si:H TFT with 0.15 cm
2
/Vs) and a desirable stability under a bias-temperature stress test. |
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ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.61.1835 |