Formation of a low-resistance and high reflectivity reflector on p-type GaN with a AgAl Ohmic contact
In this study, we investigate the effect of the Al composition of a AgAl alloy reflector deposited on a p-GaN layer for use in a high-efficiency GaN flip-chip light-emitting diode (FCLED) or n-type sideup vertical LEDs. When the Al composition was 3%, the AgAl reflector showed low resistance, high r...
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Veröffentlicht in: | Journal of the Korean Physical Society 2012, 60(10), , pp.1749-1752 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this study, we investigate the effect of the Al composition of a AgAl alloy reflector deposited on a p-GaN layer for use in a high-efficiency GaN flip-chip light-emitting diode (FCLED) or n-type sideup vertical LEDs. When the Al composition was 3%, the AgAl reflector showed low resistance, high reflectance and thermally stable ohmic contact properties. For an Al composition of 3% in the AgAl reflector, the optical output power was improved by 50%, and the current-voltage characteristic was improved compared to that for a Ag reflector. These results clearly indicate that a AgAl layer on p-GaN constitutes a promising reflector and ohmic scheme for achieving high-brightness FCLEDs and vertical LEDs. |
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ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.60.1749 |