FEL simulation of the 0.1-nm Hard X-ray from the PAL-XFEL
The Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) will provide X-ray FEL radiation in the range of 0.1 and 10 nm with five undulator beamlines. An undulator beamline for hard X-ray is designed for 0.1-nm self-amplified spontaneous emission FEL. When a 200-pC electron bunch with...
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Veröffentlicht in: | Journal of the Korean Physical Society 2014, 64(2), , pp.212-216 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) will provide X-ray FEL radiation in the range of 0.1 and 10 nm with five undulator beamlines. An undulator beamline for hard X-ray is designed for 0.1-nm self-amplified spontaneous emission FEL. When a 200-pC electron bunch with a 10-GeV energy and a 0.5-μm·rad normalized emittance passes the undulators, 10
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photons at 0.1 nm will be generated within 100 fs. The wakefield effect of the vacuum chamber may reduce the radiation power significantly, but a proper tapering in the undulator can recover the power. We present a study in which GENESIS 1.3 was used for the FEL simulation. |
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ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.64.212 |