Systematic determination of the optimized Zr content of Ba(ZrxTi1-x)O3 with high dielectric constant at room temperature for high-voltage system application

In this study, by replacing the B-site element in BaTiO 3 , a ferroelectric material, with an element with a larger ionic radius, a ferroelectric material with high permittivity at room temperature was synthesized. The powders were prepared by solid-state reaction to perform lattice substitution wit...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Hanʼguk Seramik Hakhoe chi 2024, 61(3), 412, pp.391-401
Hauptverfasser: Kim, Jandi, Seo, Ji Hye, Lee, Sang Heun, Cho, Myunghee, Kwak, Hun, Cheon, Ran Sae, Cho, Seungchan, Cho, Sung Beom, Kim, Minkee, Lee, Yoon-Seok, Kim, Yangdo, Choi, Moonhee
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this study, by replacing the B-site element in BaTiO 3 , a ferroelectric material, with an element with a larger ionic radius, a ferroelectric material with high permittivity at room temperature was synthesized. The powders were prepared by solid-state reaction to perform lattice substitution with Zr 4+ (0.72 Å), which has a larger ionic radius than Ti 4+ (0.605 Å). To perform effective solid-state reaction and better understand the correlation between variables, this study introduced a design of experiment (DOE) based on the orthogonal array (OA) method included in the PIAno software. By substituting 0.222 mol of Zr, which has a large ionic radius, the crystal structure was deformed through an effective diffuse phase transition (DPT), and this resulted in the largest improvement in permittivity at room temperature. In addition, the powder, which underwent solid-state reaction at 1300 °C, formed the densest structure during sintering, which established the conditions for realizing the best dielectric properties. These results can be utilized as a key material for improving the properties of passive devices used in high-voltage industrial systems in societies undergoing the fourth industrial revolution.
ISSN:1229-7801
2234-0491
2334-0491
DOI:10.1007/s43207-023-00353-x