Investigation of electronic and optical properties in Al−Ga codoped ZnO thin films
Electronic and optical properties of Al−Ga codoped ZnO thin films were investigated by post-annealing. The lowest resistivity of the Al–Ga codoped ZnO films was observed from the 450 °C-annealed sample. The Fermi-level shift of the Al−Ga codoped ZnO film was ∼0.6 eV from x-ray photoelectron spectros...
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Veröffentlicht in: | Current applied physics 2012, 12(3), , pp.628-631 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Electronic and optical properties of Al−Ga codoped ZnO thin films were investigated by post-annealing. The lowest resistivity of the Al–Ga codoped ZnO films was observed from the 450 °C-annealed sample. The Fermi-level shift of the Al−Ga codoped ZnO film was ∼0.6 eV from x-ray photoelectron spectroscopy, and the widening of optical-bandgap in the Al−Ga codoped ZnO film was ∼0.3 eV. The correlations of optical-bandgap with Fermi-level shift and conduction band filling were suggested by schematic band diagrams.
► The Fermi-level shift of 450 °C-annealed ZnO:(Al,Ga) film is ∼0.6 eV compared to ZnO. ► The widening of optical-bandgap energy is ∼0.3 eV. ► Conduction band filling obtained from the carrier concentration is ∼0.45 eV. ► Optical-bandgap is correlated with the Fermi-level shift and conduction band filling. |
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ISSN: | 1567-1739 1878-1675 |
DOI: | 10.1016/j.cap.2011.09.008 |