Investigation of electronic and optical properties in Al−Ga codoped ZnO thin films

Electronic and optical properties of Al−Ga codoped ZnO thin films were investigated by post-annealing. The lowest resistivity of the Al–Ga codoped ZnO films was observed from the 450 °C-annealed sample. The Fermi-level shift of the Al−Ga codoped ZnO film was ∼0.6 eV from x-ray photoelectron spectros...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Current applied physics 2012, 12(3), , pp.628-631
Hauptverfasser: Lee, Woojin, Shin, Sungjin, Jung, Dae-Ryong, Kim, Jongmin, Nahm, Changwoo, Moon, Taeho, Park, Byungwoo
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Electronic and optical properties of Al−Ga codoped ZnO thin films were investigated by post-annealing. The lowest resistivity of the Al–Ga codoped ZnO films was observed from the 450 °C-annealed sample. The Fermi-level shift of the Al−Ga codoped ZnO film was ∼0.6 eV from x-ray photoelectron spectroscopy, and the widening of optical-bandgap in the Al−Ga codoped ZnO film was ∼0.3 eV. The correlations of optical-bandgap with Fermi-level shift and conduction band filling were suggested by schematic band diagrams. ► The Fermi-level shift of 450 °C-annealed ZnO:(Al,Ga) film is ∼0.6 eV compared to ZnO. ► The widening of optical-bandgap energy is ∼0.3 eV. ► Conduction band filling obtained from the carrier concentration is ∼0.45 eV. ► Optical-bandgap is correlated with the Fermi-level shift and conduction band filling.
ISSN:1567-1739
1878-1675
DOI:10.1016/j.cap.2011.09.008