Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

Single-event effects testing (heavy-ion and proton) is presented for 96- and 176-layer commercially-available 3D NAND flash memory, with emphasis on SEFI detection and recovery.

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Bibliographische Detailangaben
Hauptverfasser: Wilcox, Edward P., Joplin, Matthew B., Berg, Melanie D.
Format: Other
Sprache:eng
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Zusammenfassung:Single-event effects testing (heavy-ion and proton) is presented for 96- and 176-layer commercially-available 3D NAND flash memory, with emphasis on SEFI detection and recovery.