A Comparison of High-Energy Electron and Cobalt-60 Gamma-Ray Radiation Testing

A Comparison of High-Energy Electron and Cobalt-60 Gamma-Ray Radiation Testing

In this paper, a comparison between the effects of irradiating microelectronics with high energy electrons and Cobalt-60 gamma-rays is examined. Additionally, the effect of electron energy is also discussed. A variety of part types are investigated, including discrete bipolar transistors, hybrids, a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Boutte, Alvin J., Campola, Michael J., Carts, Martin A., Wilcox, Edward P., Marshall, Cheryl J., Phan, Anthony M., Pellish, Jonathan A., Powell, Wesley A., Xapsos, Michael A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electronics And Electrical Engineering
Space Radiation
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this paper, a comparison between the effects of irradiating microelectronics with high energy electrons and Cobalt-60 gamma-rays is examined. Additionally, the effect of electron energy is also discussed. A variety of part types are investigated, including discrete bipolar transistors, hybrids, and junction field effect transistors