Investigation of Optimal Digital Image Correlation Patterns for Deformation Measurement

Digital image correlation (DIC) relies on the surface texture of a specimen to measure deformation. When the specimen itself has little or no texture, a pattern is applied to the surface which deforms with the specimen and acts as an artificial surface texture. Because the applied pattern has an effect on the accuracy of DIC, an ideal pattern is sought for which the error introduced into DIC measurements is minimal. In this work, a study is performed in which several DIC pattern quality metrics from the literature are correlated to DIC measurement error. The resulting correlations give insight on the optimality of DIC patterns in general. Optimizations are then performed to produce patterns which are well suited for DIC. These patterns are tested to show their relative benefits. Chief among these benefits are a reduction in error of approximately 30 with respect to a randomly generated pattern.