Characterization of a Common-Gate Amplifier Using Ferroelectric Transistors

Characterization of a Common-Gate Amplifier Using Ferroelectric Transistors

In this paper, the empirical data collected through experiments performed using a FeFET in the common-gate amplifier circuit is presented. The FeFET common-gate amplifier was characterized by varying all parameters in the circuit, such as load resistance, biasing of the transistor, and input voltage...

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Bibliographische Detailangaben
Hauptverfasser: Hunt, Mitchell, Sayyah, Rana, MacLeod, Todd C., Ho, Fat D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electronics And Electrical Engineering
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Beschreibung
Zusammenfassung:In this paper, the empirical data collected through experiments performed using a FeFET in the common-gate amplifier circuit is presented. The FeFET common-gate amplifier was characterized by varying all parameters in the circuit, such as load resistance, biasing of the transistor, and input voltages. Due to the polarization of the ferroelectric layer, the particular behavior of the FeFET common-gate amplifier presents interesting results. Furthermore, the differences between a FeFET common-gate amplifier and a MOSFET common-gate amplifier are examined.