Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics

Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Conver...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OBryan, Martha V., LaBel, Kenneth A., Reed, Robert A., Ladbury, Ray L., Howard, James W., Jr, Kniffin, Scott D., Poivey, Christian, Buchner, Stephen P., Bings, John P., Titus, Jeff L.
Format: Report
Sprache:eng
Schlagworte:
Spacecraft Instrumentation And Astrionics
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.