An analysis of the effects of secondary reflections on dual-frequency reflectometers

The error-producing mechanism involving secondary reflections in a dual-frequency, distance measuring reflectometer is examined analytically. Equations defining the phase, and hence distance, error are derived. The error-reducing potential of frequency-sweeping is demonstrated. It is shown that a si...

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Hauptverfasser: Hearn, C. P., Cockrell, C. R., Harrah, S. D.
Format: Report
Sprache:eng
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Zusammenfassung:The error-producing mechanism involving secondary reflections in a dual-frequency, distance measuring reflectometer is examined analytically. Equations defining the phase, and hence distance, error are derived. The error-reducing potential of frequency-sweeping is demonstrated. It is shown that a single spurious return can be completely nullified by optimizing the sweep width.