ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits

© 2013 IEEE. This paper presents an integrated workflow for design-for-test and test signal generation of mixed-signal circuits. The DfT phase pre-partitions the core under test and allows an efficient automatic generation of test signals.-Hans-Joachim Wunderlich, Universität Stuttgart.

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Veröffentlicht in:IEEE DESIGN & TEST 2018-06, Vol.35 (3), p.24-30
Hauptverfasser: Coyette, Anthony, Esen, Baris, Xama, Nektar, Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny
Format: Artikel
Sprache:eng
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Zusammenfassung:© 2013 IEEE. This paper presents an integrated workflow for design-for-test and test signal generation of mixed-signal circuits. The DfT phase pre-partitions the core under test and allows an efficient automatic generation of test signals.-Hans-Joachim Wunderlich, Universität Stuttgart.
ISSN:2168-2356