Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers
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| Veröffentlicht in: | Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems 2023-02, Vol.42 (10) |
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| container_title | Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems |
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| creator | Xama, nektar Gomez Caicedo, jhon alexander Dobbelaere, wim Vanhooren, Ronny Coyette, Anthony Gielen, Georges |
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| identifier | ISSN: 0278-0070 |
| ispartof | Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems, 2023-02, Vol.42 (10) |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| title | Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers |
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