Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology
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Veröffentlicht in: | IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2022-08, Vol.69 (8), p.1865-1875 |
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container_title | IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
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creator | Mounir Mahmoud, Mohamed Prinzie, J Soderstrom, D Niskanen, K Pouget, V Cathelin, A Clerc, S Leroux, P |
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title | Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology |
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