Towards a Global Approach for the Characterization of IC's and On Board Shielding Components
Due to the impact of higher and higher frequencies, the direct radiated effects of components on a PCB are becoming important. For this reason, an appropriate SE characterisation of small in-circuit enclosures and the accompanying shielding gaskets at frequencies above 1 GHz is needed. Although the...
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| creator | Catrysse, Johan Vanhee, Filip Pissoort, Davy Brull, Christian Vandenbosch, Guy |
| description | Due to the impact of higher and higher frequencies, the direct radiated effects of components on a PCB are becoming important. For this reason, an appropriate SE characterisation of small in-circuit enclosures and the
accompanying shielding gaskets at frequencies above 1 GHz
is needed. Although the standard IEEE Std 1302™ and the
standard IEEE Std 299™ are dealing with SE measurements,
even up to the higher frequency range, the methods proposed
in these standard are not applicable for these type of shielding components. A method overcoming this problem is proposed in this paper. |
| format | Conference Proceeding |
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accompanying shielding gaskets at frequencies above 1 GHz
is needed. Although the standard IEEE Std 1302™ and the
standard IEEE Std 299™ are dealing with SE measurements,
even up to the higher frequency range, the methods proposed
in these standard are not applicable for these type of shielding components. A method overcoming this problem is proposed in this paper.</description><identifier>ISBN: 9788374934268</identifier><identifier>ISBN: 8374934263</identifier><language>eng</language><publisher>Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland: Oficyna Wydawnicza</publisher><ispartof>Proceedings of EMC Europe 2010, 2010, p.889-894</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,315,778,27847</link.rule.ids><linktorsrc>$$Uhttps://lirias.kuleuven.be/handle/123456789/276785$$EView_record_in_KU_Leuven_Association$$FView_record_in_$$GKU_Leuven_Association$$Hfree_for_read</linktorsrc></links><search><contributor>Lewandowski, G</contributor><contributor>Kozlowska, A</contributor><contributor>Joskiewicz, Z.M</contributor><contributor>Janiszewski, J.M</contributor><creatorcontrib>Catrysse, Johan</creatorcontrib><creatorcontrib>Vanhee, Filip</creatorcontrib><creatorcontrib>Pissoort, Davy</creatorcontrib><creatorcontrib>Brull, Christian</creatorcontrib><creatorcontrib>Vandenbosch, Guy</creatorcontrib><title>Towards a Global Approach for the Characterization of IC's and On Board Shielding Components</title><title>Proceedings of EMC Europe 2010</title><description>Due to the impact of higher and higher frequencies, the direct radiated effects of components on a PCB are becoming important. For this reason, an appropriate SE characterisation of small in-circuit enclosures and the
accompanying shielding gaskets at frequencies above 1 GHz
is needed. Although the standard IEEE Std 1302™ and the
standard IEEE Std 299™ are dealing with SE measurements,
even up to the higher frequency range, the methods proposed
in these standard are not applicable for these type of shielding components. A method overcoming this problem is proposed in this paper.</description><isbn>9788374934268</isbn><isbn>8374934263</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>FZOIL</sourceid><recordid>eNqNjLsOgjAUQJsYB4P-w90YjIOURxmV-JocZDQhVyhCrL1NKWr8ehn8AKaznHMmbJEmQvAkTHkYxGLGrjm90VYdIBwU3VDBxhhLWDZQkwXXSMgatFg6adsvupY0UA2nzB8SXcFZw5aGAVyaVqqq1XfI6GlIS-26OZvWqDq5-NNj_n6XZ8fVo1eyf0ldVJ3BUhbrgIdRnIi0CJIBEffYcpxZuI_j478_9FhOfw</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Catrysse, Johan</creator><creator>Vanhee, Filip</creator><creator>Pissoort, Davy</creator><creator>Brull, Christian</creator><creator>Vandenbosch, Guy</creator><general>Oficyna Wydawnicza</general><scope>FZOIL</scope></search><sort><creationdate>201009</creationdate><title>Towards a Global Approach for the Characterization of IC's and On Board Shielding Components</title><author>Catrysse, Johan ; Vanhee, Filip ; Pissoort, Davy ; Brull, Christian ; Vandenbosch, Guy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-kuleuven_dspace_123456789_2767853</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Catrysse, Johan</creatorcontrib><creatorcontrib>Vanhee, Filip</creatorcontrib><creatorcontrib>Pissoort, Davy</creatorcontrib><creatorcontrib>Brull, Christian</creatorcontrib><creatorcontrib>Vandenbosch, Guy</creatorcontrib><collection>Lirias (KU Leuven Association)</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Catrysse, Johan</au><au>Vanhee, Filip</au><au>Pissoort, Davy</au><au>Brull, Christian</au><au>Vandenbosch, Guy</au><au>Lewandowski, G</au><au>Kozlowska, A</au><au>Joskiewicz, Z.M</au><au>Janiszewski, J.M</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Towards a Global Approach for the Characterization of IC's and On Board Shielding Components</atitle><btitle>Proceedings of EMC Europe 2010</btitle><date>2010-09</date><risdate>2010</risdate><spage>889</spage><epage>894</epage><pages>889-894</pages><isbn>9788374934268</isbn><isbn>8374934263</isbn><abstract>Due to the impact of higher and higher frequencies, the direct radiated effects of components on a PCB are becoming important. For this reason, an appropriate SE characterisation of small in-circuit enclosures and the
accompanying shielding gaskets at frequencies above 1 GHz
is needed. Although the standard IEEE Std 1302™ and the
standard IEEE Std 299™ are dealing with SE measurements,
even up to the higher frequency range, the methods proposed
in these standard are not applicable for these type of shielding components. A method overcoming this problem is proposed in this paper.</abstract><cop>Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland</cop><pub>Oficyna Wydawnicza</pub><oa>free_for_read</oa></addata></record> |
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| identifier | ISBN: 9788374934268 |
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| language | eng |
| recordid | cdi_kuleuven_dspace_123456789_276785 |
| source | Lirias (KU Leuven Association) |
| title | Towards a Global Approach for the Characterization of IC's and On Board Shielding Components |
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