Towards a Global Approach for the Characterization of IC's and On Board Shielding Components

Due to the impact of higher and higher frequencies, the direct radiated effects of components on a PCB are becoming important. For this reason, an appropriate SE characterisation of small in-circuit enclosures and the accompanying shielding gaskets at frequencies above 1 GHz is needed. Although the standard IEEE Std 1302™ and the standard IEEE Std 299™ are dealing with SE measurements, even up to the higher frequency range, the methods proposed in these standard are not applicable for these type of shielding components. A method overcoming this problem is proposed in this paper.