Electronics Reliability and Measurement Technology - Nondestructive Evaluation

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographische Detailangaben
1. Verfasser:	Heyman J.S
Format:	Buch
Sprache:	eng
Schlagworte:	Electronics & Semiconductors Nondestructive Evaluation Nondestructive Testing & Evaluation Properties & Testing
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.