[Encyclopedia] Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films

[Encyclopedia] Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films

This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Brundle C.Richard, Wilson Shaun, Evans Charles A. Jr
Format: Buch
Sprache:eng
Schlagworte:
Electronics & Semiconductors
General Engineering & Project Administration
Materials
Properties & Testing
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Beschreibung
Zusammenfassung:This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series.