The reflection of long X-rays

Introduction.—For X-rays passing through matter, theory and experiment give a refractive index μ slightly less than unity, so that if a beam of X-rays falls on the plane surface of a solid at a small glancing angle less than the critical glancing angle, it is totally reflected. Determinations of the...

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Veröffentlicht in:Proceedings of the Royal Society of London. Series A, Containing papers of a mathematical and physical character Containing papers of a mathematical and physical character, 1931-09, Vol.133 (821), p.292-303
1. Verfasser: Mohr, C. B. O.
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Sprache:eng
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Zusammenfassung:Introduction.—For X-rays passing through matter, theory and experiment give a refractive index μ slightly less than unity, so that if a beam of X-rays falls on the plane surface of a solid at a small glancing angle less than the critical glancing angle, it is totally reflected. Determinations of the refractive indices of short wave X-rays by the total reflection method have been carried out by a considerable number of observers. The work of Forster and of Doan is of particular importance in that determinations have been made with many refinements of technique for various substances over a range of wave-lengths.
ISSN:0950-1207
2053-9150
DOI:10.1098/rspa.1931.0148