Quick Switching System for Costly and Destructive Testing

Quick Switching System for Costly and Destructive Testing

A sampling system applicable for costly and destructive inspection is presented. For the case of defectives, selection of the system using binomial model is furnished. Comparison is made with existing plans.

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Bibliographische Detailangaben
Veröffentlicht in:Sankhyā. Series B 1992-04, Vol.54 (1), p.1-12
Hauptverfasser: Soundararajan, V., Arumainayagam, S. Devaraj
Format: Artikel
Sprache:eng
Schlagworte:
Acceptance sampling
Binomials
Destructive testing
Parametric models
Sample size
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Beschreibung
Zusammenfassung:A sampling system applicable for costly and destructive inspection is presented. For the case of defectives, selection of the system using binomial model is furnished. Comparison is made with existing plans.
ISSN:0581-5738