Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs

Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs

The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of defor...

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Veröffentlicht in:Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences physical, and engineering sciences, 1999-10, Vol.357 (1761), p.2731-2739
Hauptverfasser: Epelboin, Y., Mocella, V., Soyer, A.
Format: Artikel
Sprache:eng
Schlagworte:
Coherent radiation
Condensed Matter
Crystals
Dynamical Theory
Imaging
Materials Science
Modeling
Physics
Plane waves
Point sources
Simulation
Simulation programs
Spherical waves
Synchrotrons
Topography
Wave diffraction
Wavelengths
X-Ray Diffraction
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Zusammenfassung:The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of deformation is described.
ISSN:1364-503X
1471-2962
DOI:10.1098/rsta.1999.0462