Construction of key model for knowledge management system using AHPQFD for semiconductor industry in Taiwan
Purpose The purpose of this paper is to describe the construction of a key model for knowledge management KM systems using AHPQFD for the semiconductor industry in Taiwan. Designmethodologyapproach The performance evaluation matrix was modified to set up a standard performance matrix for system intr...
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Veröffentlicht in: | Journal of manufacturing technology management 2007-06, Vol.18 (5), p.576-597 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Purpose The purpose of this paper is to describe the construction of a key model for knowledge management KM systems using AHPQFD for the semiconductor industry in Taiwan. Designmethodologyapproach The performance evaluation matrix was modified to set up a standard performance matrix for system introduction. The importance weights of models related to KM via the analytic hierarchy process AHP and after consulting experts' opinions. The method of quality function deployment QFD was integrated for the system models of a KM system and correlation weights of key objectives to be improved. Findings Seven key objectives need to be improved. Correlations between the key objectives to be improved and the KM system models are located via QFD for eight critically important models to be improved. Research limitationsimplications In this study, the questionnaires were emailed to respondents sampled from the list of the Taiwan Semiconductor Industry Association TSIA. Practical implications Actual cases are investigated and a KM system prototype is established in this research to provide reference for the semiconductor industry when introducing a KM system. Originalityvalue Companies can evaluate the performance of system introduction rapidly and regulate their investments in resources efficiently using the measurement, analysis and improvement methods provided here so that the performance of introducing the KM system will be increased effectively at the lowest cost. |
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ISSN: | 1741-038X |
DOI: | 10.1108/17410380710752671 |