Determination of Bulk Minority-Carrier Lifetime in BaSi2 Earth-Abundant Absorber Films by Utilizing a Drastic Enhancement of Carrier Lifetime by Post-Growth Annealing

We have successfully determined the bulk minority-carrier lifetime in BaSi 2 epitaxial films by utilizing a drastic enhancement of lifetime by post-growth annealing at 800 °C, which is attributed to strain relaxation. From the film-thickness dependence of lifetime, we reveal that the bulk lifetime i...

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Veröffentlicht in:Applied physics express 2013-11, Vol.6 (11), p.112302-112302-4
Hauptverfasser: Hara, Kosuke O, Usami, Noritaka, Nakamura, Kotaro, Takabe, Ryouta, Baba, Masakazu, Toko, Kaoru, Suemasu, Takashi
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Sprache:eng
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Zusammenfassung:We have successfully determined the bulk minority-carrier lifetime in BaSi 2 epitaxial films by utilizing a drastic enhancement of lifetime by post-growth annealing at 800 °C, which is attributed to strain relaxation. From the film-thickness dependence of lifetime, we reveal that the bulk lifetime is 14 μs, which is long enough for thin-film solar cell applications. In addition, the sum of surface and interface recombination velocities is found to be as low as 8.3 cm/s presumably due to the ionic nature of BaSi 2 . This confirms that BaSi 2 is promising as an absorption-layer material for earth-abundant thin-film solar cells.
ISSN:1882-0778
1882-0786
DOI:10.7567/APEX.6.112302