Low Temperature Dependence of Oscillation Wavelength in GaAs1-xBix Laser by Photo-Pumping

Lasing oscillation from a GaAs 1-x Bi x /GaAs semiconductor chip with a Fabry--Perot cavity is acheived for the first time by photo-pumping. The GaAs 0.975 Bi 0.025 active layer was grown at a very low temperature of 350 °C by molecular beam epitaxy. The characteristic temperature of the laser was 8...

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Veröffentlicht in:Applied physics express 2010-06, Vol.3 (6), p.062201-062201-3
Hauptverfasser: Tominaga, Yoriko, Oe, Kunishige, Yoshimoto, Masahiro
Format: Artikel
Sprache:eng
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Zusammenfassung:Lasing oscillation from a GaAs 1-x Bi x /GaAs semiconductor chip with a Fabry--Perot cavity is acheived for the first time by photo-pumping. The GaAs 0.975 Bi 0.025 active layer was grown at a very low temperature of 350 °C by molecular beam epitaxy. The characteristic temperature of the laser was 83 K between 150 and 240 K. The lasing emission peak energy decreased at a constant rate of $-0.18$ meV/K, which is only 40% of the temperature coefficient of the GaAs band gap in this temperature range. Above 240 K, the lasing threshold pumping power increased sharply, and the lasing emission peak energy started shifting to a shorter wavelength.
ISSN:1882-0778
1882-0786
DOI:10.1143/APEX.3.062201